Demcon focal has developed optical measurements solutions from the meter to the sub-μm range for complex shapes and challenging environments. We have realized metrology systems based on various optical measurement principles, such as optical coherence topography (OCT), chromatic confocal methods, depth from shadow, structured light, laser and led triangulation. These technologies are used in a wide range of applications, such as height profile measurement of MEMS chip structures, inline measurement in micro-machining systems, freeform lens measurement and surface irregularities inspection. Our combined knowledge of optics and data -processing algorithms, together augmented with a system-engineering mindset, enables us to push optical measurement technology forward.
"we measure every micrometer and even every nanometer."
We combine our expertise in the field of accurate movement and positioning with in-depth optical knowledge. This way we achieve micrometer and even nanometer precision. We do this in the laboratory, as well as in industrial practice, for example to measure free-form optical surfaces or accurate alignment in lithography processes.