17 results

  • Case-Accurate-Alignment-Demcon-Focal

    high precision (sub-μm) measurements.

    Accurate pre-alignment of wafers is key for each individual processing step. Contactless wafer edge measurement requires a dedicated vision system.

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  • wafer inspection.

    Wafer inspection and chip inspection require bespoke image hardware and analysis methods.

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  • Thumbnail-showcase-inline-measurement.jpg

    inline depth measurement.

    We developed a depth sensor that uses the optical interference effect of broadband light between a reference path and signal path to derive the optical path length difference between these two branches.

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  • Case-Lithography-Lens-Design-Demcon-Focal

    lithography lens design.

    Demcon focal has the capabilities to design, deliver and qualify one of the most demanding precision optical assemblies: the lithography lens.

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  • quality control of fuel.

    Different fuels often have distinguishable chemical fingerprints.

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  • Case-In-line-Sorting-System-Demcon-Focal

    in-line sorting system.

    Near infrared (NIR) spectroscopy is suitable for polymer detection and it is a rapid, non-destructive analysis method that can be applied to an automatic in-line sorting system.

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